Fowler-Nordheim Current Oscillations Analysis of Metal/Ultra-Thin Oxide/Semiconductor Structures

2000 ◽  
Vol 182 (2) ◽  
pp. 737-753 ◽  
Author(s):  
Y. Khlifi ◽  
K. Kassmi ◽  
L. Roubi ◽  
R. Maimouni
Keyword(s):  
Oxide Semiconductor ◽  
Semiconductor Structures ◽  
Current Oscillations ◽  
Thin Oxide

Instability analysis of charges trapped in the oxide of metal-ultra thin oxide-semiconductor structures

2005 ◽  
Vol 31 (3) ◽  
pp. 169-178 ◽  
Author(s):  
A. Aziz ◽  
K. Kassmi ◽  
R. Maimouni ◽  
F. Olivié ◽  
G. Sarrabayrouse ◽  
...  
Keyword(s):  
Oxide Semiconductor ◽  
Instability Analysis ◽  
Semiconductor Structures ◽  
Thin Oxide
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